Opto-Electronic Engineering, Volume. 31, Issue 11, 59(2004)

Extracting profile feature points by a method based on arc length

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    [in Chinese], [in Chinese], [in Chinese], [in Chinese]. Extracting profile feature points by a method based on arc length[J]. Opto-Electronic Engineering, 2004, 31(11): 59

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    Received: May. 21, 2004

    Accepted: --

    Published Online: Nov. 14, 2007

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