Influence of Reflection-Induced Phase Retardation Upon the Immunity to Electromagnetic Interference ob Bluk-Glass Optic-Current Sensors

[in Chinese]; [in Chinese]; [in Chinese]; [in Chinese]; [in Chinese]; [in Chinese]; [in Chinese]; [in Chinese]

Acta Optica Sinica, Volume. 18, Issue 9, 1249(1998)

[in Chinese]¹, [in Chinese]¹, [in Chinese]¹, [in Chinese]¹, [in Chinese]¹, [in Chinese]², [in Chinese]², and [in Chinese]²

Author Affiliations

¹[in Chinese]

²Department of E.E.I.E., City University, London, ECIV OHB, U.K.

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Abstract Get PDF(in Chinese)

Reflection induced phase retardation (RPR) on light turning points of bulk glass optic current sensors would influence the immunity to electromagnetic interference of the sensors. The theoretic analysis, results of numerical simulation and experiments are presented.

Keywords

electromagnetic interference （EMI）.reflection induced phase retardation optic current sensor （OCS）

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[in Chinese], [in Chinese], [in Chinese], [in Chinese], [in Chinese], [in Chinese], [in Chinese], [in Chinese]. Influence of Reflection-Induced Phase Retardation Upon the Immunity to Electromagnetic Interference ob Bluk-Glass Optic-Current Sensors[J]. Acta Optica Sinica, 1998, 18(9): 1249

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Paper Information

Category: Optical Devices

Received: Jul. 7, 1997

Accepted: --

Published Online: Oct. 18, 2006

The Author Email:

DOI:

Topics

laser devices and laser physics

Lasers and Laser Optics

Laser physics

laser manufacturing

Instrumentation, Measurement and Metrology