Chinese Optics Letters, Volume. 6, Issue 1, 0132(2008)

Relationship between normalized light intensity and attenuated total reflection ratio

Yingcai Wu and Zhengtian Gu
Author Affiliations
  • College of Information, Guangdong Ocean University, Zhanjiang 5240252College of Science, University of Shanghai for Science and Technology, Shanghai 200093
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    Attenuated total reflection (ATR) ratio is usually utilized to study the properties of surface plasmon resonance (SPR) sensors. The relationship between normalized light intensity and ATR ratio is investigated, and a modification coefficient is put forward to describe the relationship. A mathematical expression is built up for the coefficient based on Fresnel principle. The result shows that the ATR ratio, which cannot be measured directly in experiments, can be determined with the coefficient and the normalized intensity of light. The characteristic of the coefficient is also discussed.

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    Yingcai Wu, Zhengtian Gu. Relationship between normalized light intensity and attenuated total reflection ratio[J]. Chinese Optics Letters, 2008, 6(1): 0132

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    Paper Information

    Received: Apr. 3, 2007

    Accepted: --

    Published Online: Jan. 29, 2008

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