Acta Photonica Sinica, Volume. 35, Issue 8, 1142(2006)

Measurement of Thermal Relaxation Time of Semiconductor Lasers

Chen Chen, Xin Guofeng*, Liu Rui, Qu Ronghui, and Fang Zujie
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    Based on the theory of lasing wavelength red shifting of semiconductor laser due to junction temperature rising in pulsed operation,the time-resolved spectrum was measured by means of scanning optical power during the pulse at different wavelengths with a Boxcar. The thermal relaxation time was calculated by the measured relation of peak moment of optical signal within the pulse varied with wavelength. A pulse semiconductor laser was measured,and the thermal relaxation time was obtained to be 1.2 ms.

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    Chen Chen, Xin Guofeng, Liu Rui, Qu Ronghui, Fang Zujie. Measurement of Thermal Relaxation Time of Semiconductor Lasers[J]. Acta Photonica Sinica, 2006, 35(8): 1142

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    Paper Information

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    Received: Apr. 10, 2005

    Accepted: --

    Published Online: Jun. 3, 2010

    The Author Email: Guofeng Xin (gfxin@siom.ac.cn)

    DOI:

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