Acta Photonica Sinica, Volume. 35, Issue 8, 1142(2006)
Measurement of Thermal Relaxation Time of Semiconductor Lasers
Based on the theory of lasing wavelength red shifting of semiconductor laser due to junction temperature rising in pulsed operation,the time-resolved spectrum was measured by means of scanning optical power during the pulse at different wavelengths with a Boxcar. The thermal relaxation time was calculated by the measured relation of peak moment of optical signal within the pulse varied with wavelength. A pulse semiconductor laser was measured,and the thermal relaxation time was obtained to be 1.2 ms.
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Chen Chen, Xin Guofeng, Liu Rui, Qu Ronghui, Fang Zujie. Measurement of Thermal Relaxation Time of Semiconductor Lasers[J]. Acta Photonica Sinica, 2006, 35(8): 1142
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Received: Apr. 10, 2005
Accepted: --
Published Online: Jun. 3, 2010
The Author Email: Guofeng Xin (gfxin@siom.ac.cn)
CSTR:32186.14.