Chinese Journal of Lasers, Volume. 36, Issue 9, 2277(2009)

High Power Semiconductor Lasers of New Window on Insulation Film of AlxNy

Qiao Zhongliang*, Bo Baoxue, Yao Yanping, Gao Xin, Zhang Jing, Wang Yuxia, Liu Chunling, Lu Peng, Li Hui, and Qu Yi
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    It is the most difficult point for high power semiconductor lasers to improve the abilities of lasers to resist catastrophic optical damage(COD) and work characteric of LDs. According to the principle that the energy gap of film materials can be influenced by internal strain stress, direct current magnetron sputtering has been used for preparing AlxNy dielectric films with different stresses under different deposition conditions. Broad area semiconductor lasers with a new no-absorption window has been designed considering cavity degradation of devices, peak power output has increased by 46.5 percent for the new structural device, perpedicularity divergence angle is up to 21°, parallel divergence angle is up to 6.1°. It has been less than 0.091 percent of aging speed per thousand of the LDs after testing of 2000 h aging.

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    Qiao Zhongliang, Bo Baoxue, Yao Yanping, Gao Xin, Zhang Jing, Wang Yuxia, Liu Chunling, Lu Peng, Li Hui, Qu Yi. High Power Semiconductor Lasers of New Window on Insulation Film of AlxNy[J]. Chinese Journal of Lasers, 2009, 36(9): 2277

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    Paper Information

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    Received: Oct. 31, 2008

    Accepted: --

    Published Online: Oct. 9, 2009

    The Author Email: Zhongliang Qiao (qiao2320002002@yahoo.com.cn)

    DOI:10.3788/cjl20093609.2277

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