Acta Optica Sinica, Volume. 42, Issue 20, 2013001(2022)
Delay Measurement Stability of Silicon-Based Optical Switching Delay Line Chip
Silicon-based optical switching delay line chip has a good application prospect in microwave photonic beamforming due to its simple structure and large instantaneous bandwidth. However, there are many difficulties in it's high-precision delay measurement, and the factors affecting the delay measurement stability are needed to be studied. By comparing the delay measurement stabilities of a delay test link based on optical vector network analyzing system, alignment waveguide and delay line, the main factors affecting the delay measurement stability of silicon-based optical switching delay line are analyzed experimentally. Experimental results show that chip insertion loss, input/output grating coupler package and residual Mach-Zehnder interference of delay line chip will deteriorate the on-chip delay measurement stability.
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Shangqing Shi, Pengcheng Liu, Binfeng Yun. Delay Measurement Stability of Silicon-Based Optical Switching Delay Line Chip[J]. Acta Optica Sinica, 2022, 42(20): 2013001
Category: Integrated Optics
Received: Mar. 1, 2022
Accepted: Apr. 27, 2022
Published Online: Oct. 18, 2022
The Author Email: Yun Binfeng (ybf@seu.edu.cn)