According to the requirement of testing system for infrared up-conversion materials, Ta2O5 and SiO2 are chosen as high and low refractive index materials. The film system is designed and optimized by film software after testing the dispersive curve of the materials by spectroscopic ellipsometer. The edge filter is prepared on the quartz substrate through electron-beam evaporation system, and the end-Hall ion source assisted deposition is used to improve the refractive index of the materials. By adjusting parameters of the filter and improving optical controlled method, the error accumulation of thickness at the monitor wavelengths is solved. The transmittance of the films at 808、980 and 1064 nm wavelengths are less than 0.01%, and the average transmission is over than 90% at visible band. The test results show that the edge filter meets the requirements of the testing system for infrared up-conversion materials.