Laser & Optoelectronics Progress, Volume. 54, Issue 9, 93002(2017)

Theoretical Study on High Spectral Sensitivity Interferometer Based on Superluminal and Slow Light Technology

Cai Yuanxue1、*, Ming Chengguo1, and Zhang Yundong2
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  • 1[in Chinese]
  • 2[in Chinese]
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    We analyze the normal and anomalous dispersion characteristics of optical materials, and prove that a kind of interferometer based on dispersion characteristics of optical materials can realize the combination of superluminal light and slow light. We also theoretically analyze the spectral sensitivity of Mach-Zehnder (M-Z) interferometer based on superluminal and slow light technology. Compared with the conventional M-Z interferometer which has the same structure with the above interferometer and the M-Z interferometer based on slow light technology, the spectral sensitivity of the M-Z interferometer based on superluminal and slow light technology increases sharply.

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    Cai Yuanxue, Ming Chengguo, Zhang Yundong. Theoretical Study on High Spectral Sensitivity Interferometer Based on Superluminal and Slow Light Technology[J]. Laser & Optoelectronics Progress, 2017, 54(9): 93002

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    Paper Information

    Category: Spectroscopy

    Received: Dec. 12, 2016

    Accepted: --

    Published Online: Sep. 6, 2017

    The Author Email: Yuanxue Cai (yuanxue_cai@tust.edu.cn)

    DOI:10.3788/lop54.093002

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