Laser & Optoelectronics Progress, Volume. 61, Issue 5, 0512005(2024)

Single-Beam Triaxial Atomic Magnetometer Based on Cross Bias Magnetic Field

Zinan Wu, Jialong Zhang, Mengyang He, Bokang Ren, Zilong Wang, Zhonghua Ou*, Huimin Yue**, Xiaojun Zhou, and Yong Liu
Author Affiliations
  • State Key Laboratory of Electronic Thin Films and Integrated Devices, School of Optoelectronic Science and Engineering, University of Electronic Science and Technology of China, Chengdu 610054, Sichuan , China
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    We report a single-beam triaxial atomic magnetometer based on cross bias magnetic field. Based on Bloch equation, the theory of single-beam scheme to achieve triaxial magnetic field detection is studied. To achieve triaxial magnetic field detection, the method of using cross bias magnetic field to rotate the atomic spin polarization direction is proposed and experimentally verified. By using only one single modulation magnetic field, it is possible to suppress low frequency noise and avoid the problem of magnetic field cross-talk. The experimental results show that the system response bandwidth to the magnetic field along X-axis is 90 Hz and the system sensitivity is 21 fT/(Hz1/2) under the zero-field condition. The system response bandwidth to the magnetic field along Y-axis is 130 Hz and the system sensitivity is 26 fT/(Hz1/2) when a bias magnetic field of 34 nT is applied in the Z-axis. The system response bandwidth to the magnetic field along Z-axis is 128 Hz and the system sensitivity is 29 fT/(Hz1/2) when a bias magnetic field of 38 nT is applied in the Y-axis. The proposed triaxial atomic magnetometer has the advantages of small size, simple structure and low fabrication cost, and is expected to be used in the biomedical and other fields.

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    Zinan Wu, Jialong Zhang, Mengyang He, Bokang Ren, Zilong Wang, Zhonghua Ou, Huimin Yue, Xiaojun Zhou, Yong Liu. Single-Beam Triaxial Atomic Magnetometer Based on Cross Bias Magnetic Field[J]. Laser & Optoelectronics Progress, 2024, 61(5): 0512005

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    Paper Information

    Category: Instrumentation, Measurement and Metrology

    Received: Feb. 6, 2023

    Accepted: Apr. 10, 2023

    Published Online: Feb. 29, 2024

    The Author Email: Ou Zhonghua (ozh@uestc.edu.cn), Yue Huimin (yuehuimin@uestc.edu.cn)

    DOI:10.3788/LOP230592

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