Electronics Optics & Control, Volume. 20, Issue 6, 100(2013)

Optimization Design of Double-Step-Down-Stress Accelerated Degradation Test Based on Monte-Carlo Simulation

PAN Gang... LIANG Yuying, Lv Meng and ZHANG Guolong |Show fewer author(s)
Author Affiliations
  • [in Chinese]
  • show less

    Considering to the problems of long test timehigh cost and low efficiency for the double-step-down-stress degradation test for high-reliabilitylong-life productswe presented an optimal design method based on Monte-Carlo simulation for double-step-down-stress accelerated degradation test(DSDS-ADT).Simulation was made for the acceleration test with Monte-Carlo method.Taking the number of inspections on each unitthe number of test units and inspection frequency as variablesand the total experimental cost as a constraintthe asymptotic variance estimation of 100 pth percentile of the lifetime distribution of the product as goal functionwe established the optimal designed model of DSDS-ADT based on Monte-Carlo simulation.Simulation results verify the feasibility and the validity of this methodand provided a theoretic support for optimal design of accelerated test in life prediction of electronic equipment.

    Tools

    Get Citation

    Copy Citation Text

    PAN Gang, LIANG Yuying, Lv Meng, ZHANG Guolong. Optimization Design of Double-Step-Down-Stress Accelerated Degradation Test Based on Monte-Carlo Simulation[J]. Electronics Optics & Control, 2013, 20(6): 100

    Download Citation

    EndNote(RIS)BibTexPlain Text
    Save article for my favorites
    Paper Information

    Category:

    Received: Apr. 10, 2012

    Accepted: --

    Published Online: Jun. 17, 2013

    The Author Email:

    DOI:10.3969/j.issn.1671-637x.2013.06.023

    Topics