Laser & Optoelectronics Progress, Volume. 60, Issue 18, 1811017(2023)
Terahertz Wave Reflection Regulation Based on Controllable Impedance of Silicon-Based MXene Layers
Efficient regulation of terahertz (THz) waves is crucial for their utilization in THz optical system, communications, imaging, etc. High-efficiency THz wave reflection regulation can be achieved through interface impedance matching. However, there have been no reports of THz wave regulation achieved via silicon-based interface impedance design. In this study, MXene films were fabricated on high-resistance silicon substrates using the self-assembly method, and their resistance were changed by increasing the thickness of the film. The impedance of the Si/MXene/air interface was continuously adjusted to achieve efficient THz wave attenuation. When approaching the impedance-matched state, the THz reflectivity at the interface is reduced by 83%, while the transmittance decays by approximately 30%. This study also confirmed the variation trend in THz wave reflection intensity resulting from the impedance change of the Si/MXene/air interface, employing THz wave tomography imaging technology. The silicon-based functional interface designed in this work, which offers efficient THz wave reflection regulation, presents a novel approach for achieving THz wave transmission regulation.
Get Citation
Copy Citation Text
Daoyuan Wang, Chengzhe Gao, Wanxia Huang, Kun Meng, Qiwu Shi. Terahertz Wave Reflection Regulation Based on Controllable Impedance of Silicon-Based MXene Layers[J]. Laser & Optoelectronics Progress, 2023, 60(18): 1811017
Category: Imaging Systems
Received: Apr. 11, 2023
Accepted: May. 4, 2023
Published Online: Sep. 19, 2023
The Author Email: Shi Qiwu (shiqiwu@scu.edu.cn)