Optoelectronics Letters, Volume. 20, Issue 11, 676(2024)

A method for determining the complex refractive index dispersion of absorbing materials without thickness information*

Zhichao DENG, Jianchun MEI, Jin WANG, Qing YE, and Jianguo TIAN

The complex refractive index dispersion (CRID) of absorbing materials is very important in many fields, especially in printing industry and medical research. However, due to their strong absorbing, CRID determination is still a challenge. In this study, without diluting treatment or the thickness information, a method is proposed to calculate the CRID of absorbing materials, based merely on the reflectance and transmittance spectra measurements. The method separates the CRID into absorbing part and transparent part based on Kramers-Kronig relations, and it also uses the common Cauchy dispersion formula and Fresnel reflection formula. The CRID of methyl-red-doped poly (methyl methacrylate) (MR-PMMA) (3% mass fraction) and hemoglobin (Hb) solutions (320 g/L) are determined over the spectral range from 400 nm to 750 nm, and the result shows good stability and consistency of the method.

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DENG Zhichao, MEI Jianchun, WANG Jin, YE Qing, TIAN Jianguo. A method for determining the complex refractive index dispersion of absorbing materials without thickness information*[J]. Optoelectronics Letters, 2024, 20(11): 676

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Paper Information

Category: PAPERS

Received: Nov. 22, 2023

Accepted: Dec. 25, 2024

Published Online: Dec. 25, 2024

The Author Email:

DOI:10.1007/s11801-024-3259-2

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