Infrared and Laser Engineering, Volume. 35, Issue 2, 249(2006)

Test system of parameters of composite IRFPA readout integrated circuit

[in Chinese]* and [in Chinese]
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    [in Chinese], [in Chinese]. Test system of parameters of composite IRFPA readout integrated circuit[J]. Infrared and Laser Engineering, 2006, 35(2): 249

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    Paper Information

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    Received: Jun. 13, 2005

    Accepted: Jul. 11, 2005

    Published Online: Oct. 20, 2006

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