Optics and Precision Engineering, Volume. 18, Issue 9, 2002(2010)

Projected fringe profilometry for profile measurement of high reflective surface

JIANG Hong-zhi*... ZHAO Hui-jie, LI Xu-dong and LI Dong |Show fewer author(s)
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    An improved non-contact optical measuring method, projected fringe profilometry, is proposed to realize the 3-D structure measurement of high reflective surfaces. The reflection characteristics of high reflective surfaces and their effects on phase computation are analyzed, and it is pointed out that the failure reason of the traditional projected fringe profilometry is the mismatch of the range of reflection intensity with the dynamic range of the measuring camera. Then, the techniques of light-dark fringe projection,multi-exposure time image acquisition and image synthesis are introduced to match the measuring range of intensity of camera with the range of reflection intensity. The feasibility and useable range of the method are analyzed. Finally, the processes of fringe projection and image acquisition in the improved profilometry are given. Experimental results indicate that the improved profilometry is able to handle the problems of fringe image saturation and dark images.Moreover,it has obtained 3-D data cloud more than 99.6%, and solve the problem of loss of 3-D data. In conclusions, the improved method can measure the 3-D profiles of high reflective surfaces with non-contact methods.

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    JIANG Hong-zhi, ZHAO Hui-jie, LI Xu-dong, LI Dong. Projected fringe profilometry for profile measurement of high reflective surface[J]. Optics and Precision Engineering, 2010, 18(9): 2002

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    Paper Information

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    Received: Nov. 1, 2009

    Accepted: --

    Published Online: Dec. 7, 2010

    The Author Email: Hong-zhi JIANG (jhz1862@126.com)

    DOI:

    CSTR:32186.14.

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