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Semiconductor Optoelectronics, Volume. 41, Issue 3, 426(2020)

Error Analysis of Large Aperture and Thin Beam Auto-collimating Measurement System

YAO Ming1...23 and WANG Jie1,* |Show fewer author(s)
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    YAO Ming, WANG Jie. Error Analysis of Large Aperture and Thin Beam Auto-collimating Measurement System[J]. Semiconductor Optoelectronics, 2020, 41(3): 426

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    Received: Feb. 4, 2020

    Accepted: --

    Published Online: Jun. 18, 2020

    The Author Email: Jie WANG (wangjie@sinap.ac.cn)

    DOI:10.16818/j.issn1001-5868.2020.03.023

    Topics

    laser devices and laser physics
    Lasers and Laser Optics
    Laser physics
    laser manufacturing
    Instrumentation, Measurement and Metrology