Laser & Optoelectronics Progress, Volume. 48, Issue 5, 51601(2011)

Photoluminescence of Eu-Doped MgO Irradiated with Xe Ions

Song Yin1,2、*, Zhang Chonghong1,2, Yang Yitao1,2, Li Bingsheng1,2, Ma Yizhun1,2, Gou Jie1,2, Yao Cunfeng1,2, and He Deyan1,2
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    Eu-doped MgO single crystals irradiated with 6 MeV Xe ions using 320 kV high voltage experimental platform are investigated by fluorescence spectroscopes. Photoluminescence (PL) intensity of Eu-doped MgO becomes stronger than that of MgO. PL peaks located at 380~550 nm decrease in PL spectra of Eu-doped MgO irradiated with small dose, the intensity of the emission band becomes strong when irradiation dose increases up to 5×1015/cm2. Those photoluminescence phenomena are explained by Fourier transform infrared spectra and Raman spectra.

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    Song Yin, Zhang Chonghong, Yang Yitao, Li Bingsheng, Ma Yizhun, Gou Jie, Yao Cunfeng, He Deyan. Photoluminescence of Eu-Doped MgO Irradiated with Xe Ions[J]. Laser & Optoelectronics Progress, 2011, 48(5): 51601

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    Paper Information

    Category: Materials

    Received: Aug. 20, 2010

    Accepted: --

    Published Online: May. 10, 2011

    The Author Email: Yin Song (songyin@impcas.ac.cn)

    DOI:10.3788/lop48.051601

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