Laser & Optoelectronics Progress, Volume. 51, Issue 6, 61206(2014)

Study of Optical Performance Measurement Method for X-Ray Scintillation Crystals

Han Yueping* and Li Ruihong
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  • [in Chinese]
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    A photoelectrical test method and the system are developed for messuring the optical performances of some scintillation crystals. The theoretical critical focal length of the measurement system is deduced and used in order to make the most of both X-ray photons and the effective area of the scintillation crystal panel. Furthermore, coaxial cable ordered is used to replace the carried wire to remove power noise. Experiments are successfully done to integrally test the spectral response, conversion efficiency and spatial resolution of some scintillators made by Shanxi Changcheng Microlight Equipment Co. Ltd. and the results show that the presented system is helpful to test the scintillator properties.

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    Han Yueping, Li Ruihong. Study of Optical Performance Measurement Method for X-Ray Scintillation Crystals[J]. Laser & Optoelectronics Progress, 2014, 51(6): 61206

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    Paper Information

    Category: Instrumentation, Measurement and Metrology

    Received: Jan. 2, 2014

    Accepted: --

    Published Online: May. 26, 2014

    The Author Email: Yueping Han (yuepinghan@163.com)

    DOI:10.3788/lop51.061206

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