Infrared and Laser Engineering, Volume. 36, Issue 4, 461(2007)

Analysis of temperature measurement by Pt resistance in HgCdTe detector

[in Chinese]* and [in Chinese]
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    [in Chinese], [in Chinese]. Analysis of temperature measurement by Pt resistance in HgCdTe detector[J]. Infrared and Laser Engineering, 2007, 36(4): 461

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    Paper Information

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    Received: Aug. 20, 2006

    Accepted: Oct. 8, 2006

    Published Online: Feb. 18, 2008

    The Author Email: (王飞(1981-)女辽宁昌图人博士生研究方向为激光与物质)

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