Acta Optica Sinica, Volume. 14, Issue 1, 68(1994)
In-situ calibration for 5 FW X-ray film using flat-field spectrometer
The in-situ calibration has been completed for the Shanghai 5 FW X-ray film by using the astigmatic mode flat-field spectrometer as dispersion element, spot-focused magnesium laser-produced plasma as X-ray source and multi-channel attenuative foil as a ruler of relative exposure intensity.
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[in Chinese], [in Chinese], [in Chinese], [in Chinese], [in Chinese], [in Chinese], [in Chinese], [in Chinese]. In-situ calibration for 5 FW X-ray film using flat-field spectrometer[J]. Acta Optica Sinica, 1994, 14(1): 68
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