Journal of Terahertz Science and Electronic Information Technology , Volume. 19, Issue 4, 717(2021)

Multiple t-test scheme to improve power information leakage detection capability

ZHENG Zhen*, CAI Juesong, ZHU Chunsheng, GUO Pengfei, WANG Kai, and YAN Yingjian
Author Affiliations
  • [in Chinese]
  • show less

    To cope with the multiple t-test issue in the leakage detection of side-channel power information, a leakage detection scheme is proposed to control the false discovery rate of the multiple t-test process and improve the test effectiveness. Based on the analysis of multiple-hypothesis testing issue, the false discovery rate and test effectiveness are introduced as control parameters in the multiple t-test process. Existing schemes for controlling multiple-hypothesis testing issue are introduced. Combined with the leakage detection process, the method of raising threshold and adjusting the test level is proposed to improve the existing control scheme, which is verified by experiments. The verification results show that this scheme can improve the detection capability of power information leakage and control the test errors within a certain range.

    Tools

    Get Citation

    Copy Citation Text

    ZHENG Zhen, CAI Juesong, ZHU Chunsheng, GUO Pengfei, WANG Kai, YAN Yingjian. Multiple t-test scheme to improve power information leakage detection capability[J]. Journal of Terahertz Science and Electronic Information Technology , 2021, 19(4): 717

    Download Citation

    EndNote(RIS)BibTexPlain Text
    Save article for my favorites
    Paper Information

    Category:

    Received: Dec. 6, 2019

    Accepted: --

    Published Online: Sep. 17, 2021

    The Author Email: Zhen ZHENG (1633019381@qq.com)

    DOI:10.11805/tkyda2019527

    Topics