Laser & Optoelectronics Progress, Volume. 47, Issue 8, 81201(2010)

Effect of Point Detector Position in Dual-Axes Confocal Microscopy

Jiang Qin*, Qiu Lirong, Zhao Weiqian, and Sha Dingguo
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  • [in Chinese]
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    The position of the point detector is one of the important parameters for the optical sectioning of the dual-axes confocal microscopy,so the point detector should be correctly positioned on the axis and without defocus. The effect of the point detector position in dual-axes confocal microscopy is analyzed. The results show that the slight axial offset of the point detector brings few effects on the axial intensity response,and a slight transverse offset of the point detector can introduce a shift into the axial response curve,while the main lobe of the axial response curve in shape is almost invariant,and the shift in the axis z increases as the offset increases.

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    Jiang Qin, Qiu Lirong, Zhao Weiqian, Sha Dingguo. Effect of Point Detector Position in Dual-Axes Confocal Microscopy[J]. Laser & Optoelectronics Progress, 2010, 47(8): 81201

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    Paper Information

    Category: Instrumentation, Measurement and Metrology

    Received: Mar. 1, 2010

    Accepted: --

    Published Online: Jun. 29, 2010

    The Author Email: Qin Jiang (eleanore1982@qq.com)

    DOI:10.3788/lop47.081201

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