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Acta Optica Sinica, Volume. 5, Issue 4, 310(1985)

Raman speotroscopy of the silicide WSi2 formed by co-sputtered WSix

SUN DIECHI1, YU ZENGQI1, LI FUMING1, and DU YUANCHENG2
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  • 2[in Chinese]
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    Raman speotmm of the silicide "WSi2, which occurs at 333cm-1 and 456 cm-1, has been demonstrated. Formation of silicide from co-sputtered WSix was studied by Eaman speotroscopy.

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    SUN DIECHI, YU ZENGQI, LI FUMING, DU YUANCHENG. Raman speotroscopy of the silicide WSi2 formed by co-sputtered WSix[J]. Acta Optica Sinica, 1985, 5(4): 310

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    Paper Information

    Category: Nonlinear Optics

    Received: Sep. 18, 1984

    Accepted: --

    Published Online: Sep. 16, 2011

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    Topics

    laser devices and laser physics
    Lasers and Laser Optics
    Laser physics
    laser manufacturing
    Instrumentation, Measurement and Metrology