Acta Photonica Sinica, Volume. 41, Issue 9, 1090(2012)
Calibration of Characteristic Parameters for Xray Plane Crystal on the Automatic Xray Diffractometer
Xray crystal characteristic parameters are the bases of identification of Xray crystal species and class, kinds of Xray crystal spectrometer fabrication, Xray lines intensity quantitative measurement and Xray monochromatic image diagnosis. On the automatic Xray diffractometer (XRD), based on stability and precision control of θ and 2θ goniometer, special plane crystal holder was made. Bremsstrahlung and CuKα line were attenuated for 5 orders by 40 μmthick Nickel filter, Xray sources was to be CuKα monochromatic source, and transmission power of filter was the criterion of CuKα monochromatic source. For Xray Pentaerythritol(002) plane crystal of Crystal lattice (2d) and integral reflective coefficient (Rc) of CuKα energy were calibrated, there are 2d=(0.87 425±0.00 042)nm, Rc=(1.759±0.024)×10-4 Rad respectively. This kind of experimental method is efficient and convenient on XRD in common laboratory. On XRD, other monochromatic Xray sources can be obtained by changing the material of Xray tube, and integral reflective coefficient of different energy will be obtained by the same way.
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YANG Guohong, WEI Minxi, HOU Lifei, YI Tao, LI Jun, LIU Shenye. Calibration of Characteristic Parameters for Xray Plane Crystal on the Automatic Xray Diffractometer[J]. Acta Photonica Sinica, 2012, 41(9): 1090
Received: Jan. 12, 2012
Accepted: --
Published Online: Aug. 31, 2012
The Author Email: Guohong YANG (yangg_h@sina.com)