Optics and Precision Engineering, Volume. 16, Issue 1, 55(2008)
Measurement of defect depth by infrared thermal wave nondestructive evaluation based on pulsed phase
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[in Chinese], [in Chinese], [in Chinese], [in Chinese]. Measurement of defect depth by infrared thermal wave nondestructive evaluation based on pulsed phase[J]. Optics and Precision Engineering, 2008, 16(1): 55
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