Infrared and Laser Engineering, Volume. 35, Issue 1, 75(2006)
Amelioration and precision improving of slit width measurement system based on the orthogonal linear CCD
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[in Chinese], [in Chinese]. Amelioration and precision improving of slit width measurement system based on the orthogonal linear CCD[J]. Infrared and Laser Engineering, 2006, 35(1): 75