Optoelectronic Technology, Volume. 43, Issue 3, 212(2023)

Liquid Deposition Method of Hafnium Oxide Thin Films

Yifeng LIU1,2, Junyang NIE4, Kaixin ZHANG1,2, Chang LIN1,2, Min LI2, Qun YAN1,2,5, and Jie SUN1,2,3
Author Affiliations
  • 1National and Local United Engineering Laboratory of Flat Panel Display Technology, Fuzhou University, and Fujian Science and Technology Innovation Laboratory for Optoelectronic Information of China, Fuzhou 35000, CHN
  • 2Fujian Science and Technology Innovation Laboratory for Optoelectronic Information of China,Fuzhou 350100, CHN
  • 3Quantum Device Physics Laboratory, Chalmers University of Technology, Göteborg41296, Sweden
  • 4Faculty of Electronic and Information Engineering, Xi’an Jiaotong University, Xi’an71009, CHN
  • 5Rich Sense Electronics Technology Co., Ltd., Quanzhou Fujian 362200, CHN
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    HfO2 films were successfully prepared by low-cost and easy-to-operate liquid deposition method, and the surface appearance, composition, optical characteristics, and electrical properties of HfO2 thin films generated by liquid deposition method were studied, as well as the reaction mechanism. The results revealed that the chemical composition of HfO2 thin films generated by liquid deposition method was pure and the structure was dense and continuous. The transmittance of HfO2 films after annealing at 500 ℃was greater than 92%; after making a plate capacitor with 40 nm hafnium oxide as the dielectric, the leakage current density at the voltage of 1 V was 3.56×10-7 A/cm2; the capacitance value at the 1 MHz frequency was 1.05 nF, yielding a calculated permittivity of 18.9.The successful preparation of hafnium oxide thin film by liquid deposition could provide a low-cost and simple method for using hafnium oxide thin film as the passivation layer of Micro LED devices.

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    Yifeng LIU, Junyang NIE, Kaixin ZHANG, Chang LIN, Min LI, Qun YAN, Jie SUN. Liquid Deposition Method of Hafnium Oxide Thin Films[J]. Optoelectronic Technology, 2023, 43(3): 212

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    Paper Information

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    Received: Nov. 28, 2022

    Accepted: --

    Published Online: Mar. 21, 2024

    The Author Email:

    DOI:10.19453/j.cnki.1005-488x.2023.03.005

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