Infrared and Laser Engineering, Volume. 48, Issue 6, 603012(2019)
High-throughput and fast-speed Fourier ptychographic microscopy: A review
Fourier ptychographic microscopy(FPM) is a promising label-free computational imaging technique with high resolution, wide field-of-view(FOV) and quantitative phase recovery. Due to its flexible setup, promising high-contrast performance without mechanical scanning and interferometric measurements, FPM has wide applications in the digital pathology, observation and dynamic imaging of label-free cells in vitro. In this review, the principle, research status and the latest advances were introduced in several aspects of FPM such as the system calibration methods, high-throughput imaging and high-speed imaging. The current problems and future trends were also presented.
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Pan An, Yao Baoli. High-throughput and fast-speed Fourier ptychographic microscopy: A review[J]. Infrared and Laser Engineering, 2019, 48(6): 603012
Category: 特约专栏-“计算成像技术与应用”
Received: Jan. 5, 2019
Accepted: Feb. 3, 2019
Published Online: Jul. 29, 2019
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