To explore the influence of a double-vortex optical interference pattern on the precision of micromeasurement, a method to measure the characteristics of the self-interference pattern of an optical vortex is proposed based on the principle of double-vortex optical interference. In this paper, the factors affecting the interference image of two vortex beams are analyzed, and an optical system is designed and built to measure the characteristics of the double-vortex optical interference pattern with shear interferometry. By collecting the interference images after different displacements of the objects in the system under the same conditions and analyzing the effect of the positions of two vortex beams and the number of topological charges on the interference image with the method of image correlation processing, a conclusion can be drawn from the measured deviation of a double-vortex optical interferogram that the pixel positions of the two phase singularities are (351, 251) and (151, 251) and the topological charge is 1 as the minimum when the fringe angle and width are 0° and 0.1714 mm, respectively, from comparing the results with the theoretical value. It means that the double-vortex optical interference images with low topological charge and phase singularities located in the center of the image and the alignment direction orthogonal to the fringe direction are more suitable for micromeasurement.