Chinese Optics Letters, Volume. 12, Issue 9, 092901(2014)

Calculation and analysis of Mueller matrix in light scattering detection

Keding Yan1,2,3, Shouyu Wang1,2,3, Shu Jiang4, Liang Xue5, Yuanyuan Song6, Zhengang Yan7, and Zhenhua Li1,2,3
Author Affiliations
  • 1Department of Information Physics &
  • 2Engineering, Nanjing University of Science &
  • 3Technology, Nanjing 210094, China
  • 4704 Institute, China Shipbuilding Industry Corporation, Shanghai 200031, China
  • 5College of Electronic and Information Engineering, Shanghai University of Electric Power, Shanghai 200090, China
  • 6China North Vehicle Research Institute, Beijing 100072, China
  • 7Xi'an Modern Control Technology Institute, Xi'an 710065, China
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    A new criterion for target detection and identification is proposed to realize metal/dielectric identification and recognition based on Mueller matrix analysis. By using randomly rough surfaces as targets, numerical calculations are used to prove the robustness and accuracy of the criterion. Moreover, to the best of our knowledge, this is the first time to successfully explain the criterion by theoretical analysis. We believe the work provides an important reference for polarization imaging in laser radar and remote sensing, and so on.

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    Keding Yan, Shouyu Wang, Shu Jiang, Liang Xue, Yuanyuan Song, Zhengang Yan, Zhenhua Li. Calculation and analysis of Mueller matrix in light scattering detection[J]. Chinese Optics Letters, 2014, 12(9): 092901

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    Paper Information

    Category: Scattering

    Received: Apr. 3, 2014

    Accepted: May. 20, 2014

    Published Online: Aug. 21, 2014

    The Author Email:

    DOI:10.3788/col201412.092901

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