Acta Optica Sinica, Volume. 41, Issue 15, 1531001(2021)

Light-Driven Technology Based on MEMS Infrared Conversion Films

Xiaole Zhang1,2, Zhuo Li1,2, Yanze Gao1,2、*, Rui Shi1,2, Jian Song1,2, Qingfeng Shi1,2, Jitian Li1,2, and Sichen Zhang1,2
Author Affiliations
  • 1School of Optics and Photonics, Beijing Institute of Technology, Beijing 100081, China
  • 2Beijing Key Laboraory for Precision Optoelectronic Measurement Instrument and Technology, Beijing 100081, China
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    Micro-electro-mechanical system (MEMS) infrared conversion film, which can convert write visible light images into infrared images, is widely used in infrared target simulators. When an infrared focal plane detector is docking with an infrared target simulator, the integration time of detector must be greater than the display time of infrared image to collect all the gray scales of infrared image. A light-driven technology based on MEMS infrared conversion film is proposed in this paper. Energy of write visible light image is integrated with thermal inertia of the film, which reduces requirement for integration time of infrared detector. Temperature characteristics of the film in the light-driven state are simulated and tested. Results show that the gray value of infrared image generated by the film is linearly related to that of write visible light image. The infrared image has heating time of 9 ms, keeping time of 1 ms, and cooling time of 10 ms. The detector can get a 256 gray-scale infrared image by integrating for any period during keeping time. The maximum temperature rise of infrared image is 112 K, and the temperature resolution corresponding to the unit gray value of infrared image is 0.44 K.

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    Xiaole Zhang, Zhuo Li, Yanze Gao, Rui Shi, Jian Song, Qingfeng Shi, Jitian Li, Sichen Zhang. Light-Driven Technology Based on MEMS Infrared Conversion Films[J]. Acta Optica Sinica, 2021, 41(15): 1531001

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    Paper Information

    Category: Thin Films

    Received: Dec. 31, 2020

    Accepted: Mar. 8, 2021

    Published Online: Aug. 31, 2021

    The Author Email: Gao Yanze (gao_yanze@bit.edu.cn)

    DOI:10.3788/AOS202141.1531001

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