Acta Optica Sinica, Volume. 33, Issue 1, 123003(2013)

Subwavelength Imaging Characteristics of the Near-Infrared Silicon-Based Metallic Photonic Crystal Slabs

Chen Xuchong*, Feng Shuai, Zhang Beibei, Li Chao, and Wang Yiquan
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    The subwavelength imaging properties of the two-dimensional square-lattice and triangular-lattice photonic crystals consisting of square metals immersed in the silicon background are studied by the finite-difference time-domain method. The Drude model is adopted to describe the metal′s dispersion characteristics, which is in a good agreement with the metal′s actual permittivity for the near-infrared wavelengths. Subwavelength imaging for the wavelength around 1550 nm is obtained through designing the parameters of the above two structures. It is found that the influence of metal′s absorption to the incident light can degrade the image spot′s intensity for a little degree, but it is trivial to degrade the subwavelength image′s quality. Compared with the traditional photonic crystal subwavelength-imaging devices consisting of air holes immersed in silicon, this kind of all-solid photonic crystal device consisting of metals immersed in silicon is more stable and can be actually applied in the complex all-optical integrated circuits.

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    Chen Xuchong, Feng Shuai, Zhang Beibei, Li Chao, Wang Yiquan. Subwavelength Imaging Characteristics of the Near-Infrared Silicon-Based Metallic Photonic Crystal Slabs[J]. Acta Optica Sinica, 2013, 33(1): 123003

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    Paper Information

    Category: Optical Devices

    Received: Jul. 10, 2012

    Accepted: --

    Published Online: Nov. 22, 2012

    The Author Email: Xuchong Chen (walsh_chen@163.com)

    DOI:10.3788/aos201333.0123003

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