Optoelectronics Letters, Volume. 17, Issue 2, 107(2021)
3D defect detection of connectors based on structured light
In order to realize the rapid detection of three-dimensional defects of connectors, this paper proposes a method for detecting connector defects based on structured light. This method combines structured light with binocular stereo vision to obtain three-dimensional data for the connector. Point cloud registration is used to identify defects and decision trees are used to classify defects. The accuracy of the 3D reconstruction results in this paper is 0.01 mm, the registration accuracy of the point cloud reaches the sub-millimeter level, and the final defect classification accuracy is 94%. The experimental results prove the effectiveness of the proposed three-dimensional connector defect detection method in connector defect detection and classification.
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JI Yue, CHEN Yang, SONG Li-mei, YANG Yan-gang, YANG Huai-dong. 3D defect detection of connectors based on structured light[J]. Optoelectronics Letters, 2021, 17(2): 107
Received: Dec. 10, 2019
Accepted: Feb. 19, 2020
Published Online: Sep. 2, 2021
The Author Email: Li-mei SONG (lilymay1976@126.com)