Optoelectronics Letters, Volume. 17, Issue 2, 107(2021)

3D defect detection of connectors based on structured light

Yue JI1... Yang CHEN1, Li-mei SONG1,*, Yan-gang YANG2 and Huai-dong YANG3 |Show fewer author(s)
Author Affiliations
  • 1Key Laboratory of Advanced Electrical Engineering and Energy Technology, Tiangong University, Tianjin 300387, China
  • 2School of Mechanical Engineering, Tianjin University of Technology and Education, Tianjin 300222, China
  • 31Department of Precision Instrument, Tsinghua University, Beijing 100084, China
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    In order to realize the rapid detection of three-dimensional defects of connectors, this paper proposes a method for detecting connector defects based on structured light. This method combines structured light with binocular stereo vision to obtain three-dimensional data for the connector. Point cloud registration is used to identify defects and decision trees are used to classify defects. The accuracy of the 3D reconstruction results in this paper is 0.01 mm, the registration accuracy of the point cloud reaches the sub-millimeter level, and the final defect classification accuracy is 94%. The experimental results prove the effectiveness of the proposed three-dimensional connector defect detection method in connector defect detection and classification.

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    JI Yue, CHEN Yang, SONG Li-mei, YANG Yan-gang, YANG Huai-dong. 3D defect detection of connectors based on structured light[J]. Optoelectronics Letters, 2021, 17(2): 107

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    Paper Information

    Received: Dec. 10, 2019

    Accepted: Feb. 19, 2020

    Published Online: Sep. 2, 2021

    The Author Email: Li-mei SONG (lilymay1976@126.com)

    DOI:10.1007/s11801-021-9212-8

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