Chinese Optics Letters, Volume. 9, Issue 8, 081002(2011)

Novel averaging window f ilter for SIFT in infrared face recognition

Junfeng Bai1, Yong Ma2, Jing Li2, Fan Fan2, and Hongyuan Wang1
Author Affiliations
  • 1Department of Electronic and Information Engineering, Huazhong University of Science and Technology, Wuhan 430074, China
  • 2Department of Electronic and Information Engineering, Wuhan National Laboratory for Opto-Electronics, Huazhong University of Science and Technology, Wuhan 430074, China
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    The extraction of stable local features directly affects the performance of infrared face recognition algorithms. Recent studies on the application of scale invariant feature transform (SIFT) to infrared face recognition show that star-styled window filter (SWF) can filter out errors incorrectly introduced by SIFT. The current letter proposes an improved filter pattern called Y-styled window filter (YWF) to further eliminate the wrong matches. Compared with SWF, YWF patterns are sparser and do not maintain rotation invariance; thus, they are more suitable to infrared face recognition. Our experimental results demonstrate that a YWF-based averaging window outperforms an SWF-based one in reducing wrong matches, therefore improving the reliability of infrared face recognition systems.

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    Junfeng Bai, Yong Ma, Jing Li, Fan Fan, Hongyuan Wang. Novel averaging window f ilter for SIFT in infrared face recognition[J]. Chinese Optics Letters, 2011, 9(8): 081002

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    Paper Information

    Category: Image processing

    Received: Dec. 21, 2010

    Accepted: Mar. 24, 2011

    Published Online: Jun. 20, 2011

    The Author Email:

    DOI:10.3788/COL201109.081002

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