Acta Optica Sinica, Volume. 38, Issue 6, 0624001(2018)
Single Nanoparticle Label-Free Imaging Based on Evanescent Wave In-Plane Scattering
A method for label-free imaging to single nanoparticle by evanescent wave in-plane scattering is presented. Using the two evanescent waves of total internal reflection (TIR) evanescent wave and surface plasmon polaritons (SPPs) to interact with a single nanoparticle, respectively, which excites the nanoparticle polarization and scatter. Generated interfacial scattering is interfered with incident evanescent wave, which forms a characteristic imaging of the polarization field of the nanoparticles and the parabolic interference fringes. Single nanoparticle label-free imaging is performed on three polystyrene nanoparticles with the diameters of 500, 200, 100 nm. The imaging results of two evanescent wave in-plane scattering on single nanoparticle are compared. It indicates that the nanoparticle polarization of SPPs in-plane scattering is approximately 10 times stronger than that of TIR in-plane scattering and close to dark field imaging. As a result, SPPs in-plane scattering manifests the better sensitivity to label-free single nanoparticle imaging. This single nanoparticle label-free imaging method can be extended to areas such as virus detection and single bio-molecule imaging.
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Liwen Jiang, Xuqing Sun, Hongyao Liu, Yaqin Chen, Wei Xiong, Chaoqian Zhang, Xinchao Lu. Single Nanoparticle Label-Free Imaging Based on Evanescent Wave In-Plane Scattering[J]. Acta Optica Sinica, 2018, 38(6): 0624001
Category: Optics at Surfaces
Received: Nov. 14, 2017
Accepted: --
Published Online: Jul. 9, 2018
The Author Email: Lu Xinchao (luxinchao@ime.ac.cn)