Laser & Optoelectronics Progress, Volume. 58, Issue 11, 1112002(2021)

Method for Calibrating Optical Axis Based on Characteristics of Optical Nodes

Tianyuan Gao1,2、*, Han Zhang1,2, Zhiying Liu1,2, Guiyuan Jia1,2, Xu Han1,2, Jiake Wang1,2, and Xiandong Cheng3
Author Affiliations
  • 1College of Optoelectronic Engineering, Changchun University of Science and Technology, Changchun , Jilin 130022, China
  • 2Key Laboratory of Optoelectronic Measurement and Control and Optical Information Transmission Technology Ministry of Education, Changchun , Jilin 130022, China
  • 3Jilin Provincial Education Examination Institute, Changchun , Jilin 130033, China
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    The optical axis of a transmission optical system cannot be found directly. To solve this problem, an optical axis calibration method based on the characteristics of optical nodes is proposed. The method is used to investigate the characteristics of a node and an equivalent node, by observing the focal plane image point displacement change, the location of the node to calibrate the optical axis of the system is determined. Furthermore, based on this method, the bidirectional exchange standard double autocollimation optical axis calibration device of parallel light pipe is designed, including imaging thrusting at the receiving end type structure design, which can effectively avoid the influence of the wavefront error. Finally, the feasibility of the proposed method is verified. Experiment results show that the proposed method has high optical axis calibration accuracy and wide adaptability. The optical axis calibration accuracy of the lens optical system is 7.7", which provides an auxiliary means for testing and adjusting lens optical systems in space optics and national defense fields.

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    Tianyuan Gao, Han Zhang, Zhiying Liu, Guiyuan Jia, Xu Han, Jiake Wang, Xiandong Cheng. Method for Calibrating Optical Axis Based on Characteristics of Optical Nodes[J]. Laser & Optoelectronics Progress, 2021, 58(11): 1112002

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    Paper Information

    Category: Instrumentation, Measurement and Metrology

    Received: Sep. 18, 2020

    Accepted: Nov. 12, 2020

    Published Online: Jun. 7, 2021

    The Author Email: Gao Tianyuan (gty@cust.edu.cn)

    DOI:10.3788/LOP202158.1112002

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