Acta Optica Sinica, Volume. 31, Issue 1, 116002(2011)

Growth and Spectral Properties of Tm:YLiF4 Crystals

Chen Guangzhu1、*, Hang Yin1, Peng Haiyan1, Zhang Lianhan1, Yin Jigang1,2, Xiong Jing1,2, He Xiaoming1, and Xu Jianqiu3
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  • 1[in Chinese]
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  • 3[in Chinese]
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    High optical quality 2% number fraction of thulium replacemented yttrium atoms Tm:YLiF4 (YLF) crystal is successfully grown by the Czochralski technique with the medium frequency induction heating furnace. The structure of TmYLF crystal is determined by the precise X ray diffraction (XRD) measurement. And the spectral properties of TmYLF crystal are studied and analyzed by absorption and fluorescence spectra. Absorption coefficient and absorption section of Tm ion at different wavelengths are calculated. At room temperature, TmYLFslabs made by 2% thulium-doped single crystal are end-pumped by a laser diode stack at wavelength of 793 nm. Laser output of 54.4 W continuous wave power at 160 W input power is achieved, corresponding to an optical efficiency of 31.2%.

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    Chen Guangzhu, Hang Yin, Peng Haiyan, Zhang Lianhan, Yin Jigang, Xiong Jing, He Xiaoming, Xu Jianqiu. Growth and Spectral Properties of Tm:YLiF4 Crystals[J]. Acta Optica Sinica, 2011, 31(1): 116002

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    Paper Information

    Category: Materials

    Received: May. 17, 2010

    Accepted: --

    Published Online: Dec. 24, 2010

    The Author Email: Guangzhu Chen (gzhchen@siom.ac.cn)

    DOI:10.3788/aos201131.0116002

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