Acta Optica Sinica, Volume. 2, Issue 1, 79(1982)
A reticle method for exactly measuring Gaussian optical spot parameter
Measurement of IR optical spot is of great importance to physics and technology. In this paper, we present a reticle method for exactly measuring Gaussian optical spot parameter. Reticle method may be used for fast, accurate measurement of Gaussian optical spot parameter. Suppose the brightness of a spot is a Gaussian model, when optical spot scans over the bars reticle, the parameter of Gaussian optical spot can be exactly known with measuring peak value of frequency spectrum.
Get Citation
Copy Citation Text
XU SHENLONG, YIN DAREN. A reticle method for exactly measuring Gaussian optical spot parameter[J]. Acta Optica Sinica, 1982, 2(1): 79