Journal of Infrared and Millimeter Waves, Volume. 44, Issue 1, 35(2025)

Research on highly sensitive infrared imaging detection technology based on linear avalanche device

Chang-Qing LIN1...3, Shuang-Xi ZHOU1,2, Lu-Fang LI1,3, Gao-Rui LIU1,3, Hai-Bin SUN1,3, Yu ZHANG1,3, Jia-Mu LIN1, and Sheng-Li SUN13,* |Show fewer author(s)
Author Affiliations
  • 1Shanghai Institute of Technical Physics,Chinese Academy of Sciences,Shanghai 200083,China
  • 2University of Chinese Academy of Sciences,Beijing 100049,China
  • 3Key Laboratory of Intelligent Infrared Sensing,Chinese Academy of Sciences,Shanghai 200083,China
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    With the development of remote sensing technology, the detection sensitivity of infrared system is increasingly required. The infrared imaging detection technology based on linear avalanche device can effectively improve the detection sensitivity in high frame frequency applications. Based on the short-wave infrared linear avalanche detector assembly of 512×512, a small-aperture and lightweight infrared imaging system is designed and its performance is tested under low reverse bias. The test results show that the increase of SNR of the imaging system based on the linear avalanche infrared detector is basically linear with the multiplication factor M under short integration time, and the SNR of the system is 3 times that of the traditional camera of the same caliber.

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    Chang-Qing LIN, Shuang-Xi ZHOU, Lu-Fang LI, Gao-Rui LIU, Hai-Bin SUN, Yu ZHANG, Jia-Mu LIN, Sheng-Li SUN. Research on highly sensitive infrared imaging detection technology based on linear avalanche device[J]. Journal of Infrared and Millimeter Waves, 2025, 44(1): 35

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    Paper Information

    Category: Infrared Physics, Materials and Devices

    Received: Apr. 18, 2024

    Accepted: --

    Published Online: Mar. 5, 2025

    The Author Email: SUN Sheng-Li (plam_sun@mail.sitp.ac.cn)

    DOI:10.11972/j.issn.1001-9014.2025.01.006

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