Infrared and Laser Engineering, Volume. 49, Issue 1, 103011(2020)

Progress of very high sensitivity infrared detector readout circuit

Chen Xiao1,2, Li Lihua1, Liang Yan1, Hu Yanbo1, Li Ming1, Yao Libin1, Zhao Changming2, Zhao Peng1, and Li Wenxia1
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  • 1[in Chinese]
  • 2[in Chinese]
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    The key to realize very high sensitivity infrared detector is to obtain as much charge storage capacity as possible in the limited pixel area of readout circuit. The pixel-level ADC based on pulse frequency modulation is the main method to realize the readout circuit of very sensitive infrared detector. The principle of pixel-level pulse frequency modulation ADC was described. The progress of pixel-level digital readout circuit in MIT Lincoln Laboratory of the USA and CEA-LETI of France were introduced. As a new technology of expanding circuit density from three-dimensional space, the progress of 3D readout circuit was introduced. Finally, the development of readout circuit for very high sensitivity infrared detector in Kunming Institute of Physics was introduced. Using pixel-level ADC technology and digital domain TDI technology, the long-wave 512×8 digital TDI infrared detector assembly was developed by Kunming Institute of Physics with the peak sensitivity of 1.5 mK.

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    Chen Xiao, Li Lihua, Liang Yan, Hu Yanbo, Li Ming, Yao Libin, Zhao Changming, Zhao Peng, Li Wenxia. Progress of very high sensitivity infrared detector readout circuit[J]. Infrared and Laser Engineering, 2020, 49(1): 103011

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    Paper Information

    Category: 特约专栏———新型红外器件

    Received: Nov. 25, 2019

    Accepted: Dec. 30, 2019

    Published Online: Jun. 8, 2020

    The Author Email:

    DOI:10.3788/irla202049.0103011

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