Refractive Index and Absorption of Cobalt Phthalocyanine Thin Film

[in Chinese]; [in Chinese]; [in Chinese]

Acta Optica Sinica, Volume. 16, Issue 2, 207(1996)

[in Chinese], [in Chinese], and [in Chinese]

Author Affiliations

[in Chinese]

show less

Abstract Get PDF(in Chinese)

A cobalt phthalocyanine (CoPc) thin film was obtained by vacuum deposition on a single crystal silicon. The ellipsometric spectra of CoPc thin film have been investigated on a scanning ellipsometer with the analyser and polarizer rotate synchronously. The spectrum is explained with its energy levels.

Keywords

ellipsometric spectrum thin film cobalt phthalocyanine

Tools

Get Citation

Copy Citation Text

[in Chinese], [in Chinese], [in Chinese]. Refractive Index and Absorption of Cobalt Phthalocyanine Thin Film[J]. Acta Optica Sinica, 1996, 16(2): 207

Download Citation

EndNote(RIS)BibTex Plain Text

Set citation alerts for article

Save article for my favorites