Chinese Optics Letters, Volume. 7, Issue 5, 05432(2009)

Optoelectronic characterization of ZnS/PS systems

Caifeng Wang, Qingshan Li, and Bo Hu
Author Affiliations
  • Department of Physics and Electronics Science, Binzhou University, Binzhou 256603, China2 Physics Department, Ludong University, Yantai 264025, China3 Flying College, Binzhou University, Binzhou 256603, ChinaE-mail: cfwang_2004@163.com
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    ZnS thin films are deposited on porous silicon (PS) substrates with different porosities by pulsed laser deposition (PLD). The photoluminescence (PL) spectra of the samples are measured at room temperature. The results show that the PL intensity of PS after deposition of ZnS increases and is associated with a blue shift. With the increase of PS porosity, a green emission at about 550 nm is observed in the PL spectra of ZnS/PS systems, which may be ascribed to the defect-center luminescence of ZnS films. Junction current-voltage (I-V) characteristics were studied. The rectifying behavior of I-V characteristics indicates the formation of ZnS/PS heterojunctions, and the forward current is seen to increase when the PS porosity is increased.

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    Caifeng Wang, Qingshan Li, Bo Hu. Optoelectronic characterization of ZnS/PS systems[J]. Chinese Optics Letters, 2009, 7(5): 05432

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    Paper Information

    Received: Aug. 11, 2008

    Accepted: --

    Published Online: May. 22, 2009

    The Author Email:

    DOI:10.3788/COL20090705.0432

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