Aiming at the vibration fatigue characteristics of electronic equipments, a random load process based on frequency analysis method is proposed. At first, the frequency dynamic response characteristics of the structure are calculated. And then, the fatigue damage model of the electronic equipment is established combining with the three interval method proposed by Steinberg. The fatigue life of the vulnerable parts of the electronic equipment is simulated and analyzed by using the finite element method, and the cumulative damage value of the vulnerable parts of the electronic equipment is calculated. The research results have certain reference and guiding significance for the design and development of electronic equipments.