Laser & Optoelectronics Progress, Volume. 53, Issue 4, 43101(2016)
Determination of Optical Constants and Thickness of Polymer Semiconductor Thin Film by Reflectivity Fitting Method
Optical constants (refractive index and extinction coefficient) of polymer semiconductor thin films are of great significance to perform optimization design. The Forouhi-Bloomer (F-B) dispersion models are applied by fitting reflectivity curves of P3HT (poly(3-hexylthiophene)):PCBM ([6,6]-phenyl-C61-butyric acid methyl ester), MEH-PPV (poly[2-methoxy-5-(2′ethyl-hexyloxy)-1,4-phenylenevinylene]):PCBM, and PEDOT (poly (3,4-ethylene dioxythiophene)):PSS (polystyrenesulfonate). The optical constants and thickness are calculated, and two reflectance curves fit well. The thickness mismatch between the fitting and measurement results is less than 3%. Based on this method, the influence of thermal annealing on the P3HT:PCBM film surface morphology and the optical constants is analyzed. The maximum refraction index of P3HT:PCBM increases from 1.95 to 2.16 in the wavelength range of 550 nm to 700 nm after the thermal annealing process at 110 ℃ and the peak of extinction coefficient shifts to longer wavelength.
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Li Guolong, Zhong Jingming, Wang Lihui, Li Jin, He Lijun, Li Haibo, Gao Mangmang. Determination of Optical Constants and Thickness of Polymer Semiconductor Thin Film by Reflectivity Fitting Method[J]. Laser & Optoelectronics Progress, 2016, 53(4): 43101
Category: Thin Films
Received: Oct. 9, 2015
Accepted: --
Published Online: Mar. 25, 2016
The Author Email: Guolong Li (331932137@qq.com)