Acta Optica Sinica, Volume. 19, Issue 7, 1006(1999)

Light Scattering Measurement of Surface Roughness by Variable Wave Vectors

[in Chinese], [in Chinese], and [in Chinese]
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    Based on the linear relationship between the logarithm of the central peak energy and k2⊥ in light scattering, a method for the measurement of surface roughness by changing the wave vectors is proposed. Experimental measurements of 6 samples of silicon backsides were conducted

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    [in Chinese], [in Chinese], [in Chinese]. Light Scattering Measurement of Surface Roughness by Variable Wave Vectors[J]. Acta Optica Sinica, 1999, 19(7): 1006

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    Paper Information

    Category: Rapid communications

    Received: Nov. 3, 1998

    Accepted: --

    Published Online: Aug. 9, 2006

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