Acta Optica Sinica, Volume. 15, Issue 12, 1717(1995)
Refractive Index and Absorption of Copper Phthalocyanine Thin Film
A copper phthalocyanine (CuPc) thin film was prefered by vacuum deposition on a single- crystal silicon. The ellipsometric spectra of CuPc thin film have been investigated on a scanning ellipsometer with the analyser and polarizer rotating syllchronously. The spectrum is explained with its energy levels.
Keywords
Tools
Get Citation
Copy Citation Text
[in Chinese], [in Chinese], [in Chinese]. Refractive Index and Absorption of Copper Phthalocyanine Thin Film[J]. Acta Optica Sinica, 1995, 15(12): 1717
Paper Information
© Copyright 2018-2021 | Chinese Laser Press.
All Rights Reserved 沪ICP备15018463号-20