Laser & Optoelectronics Progress, Volume. 59, Issue 13, 1312002(2022)

Hybrid-Coded Phase-Shifting Profilometry for Structured Light Measurement

Xinyi Zeng, Shiqian Wu, and Bin Chen*
Author Affiliations
  • Institute of Robotics and Intelligent Systems, School of Information Science and Engineering, Wuhan University of Science and Technology, Wuhan 430081, Hubei , China
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    In this paper, we proposed a hybrid coding method that includes both phase order and relative wrapped phase to quickly and accurately obtain three-dimensional information of spatially discontinuous objects. Based on the traditional phase-shifting profilometry, the phase order was modulated into the phase-shifting image using the De Bruijn sequence. The length of the De Bruijn sequence used is the number of periods, where each code value corresponds to a phase period. After calculating the wrapped phase, the code sequence corresponding to each period was matched with the De Bruijn sequence to verify whether the location of the code in the De Bruijn sequence is the phase order. The proposed method need not project additional images to encode the phase order as both the phase order and the wrapped phase required by the unwrapped phase can be obtained from the projected phase-shifting patterns. The experimental results show that when only four images are projected, the three-dimensional morphology of the objects to be measured can be reconstructed, and the standard deviation of the reconstructed plate is 0.319 mm.

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    Xinyi Zeng, Shiqian Wu, Bin Chen. Hybrid-Coded Phase-Shifting Profilometry for Structured Light Measurement[J]. Laser & Optoelectronics Progress, 2022, 59(13): 1312002

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    Paper Information

    Category: Instrumentation, Measurement and Metrology

    Received: Jul. 1, 2021

    Accepted: Aug. 23, 2021

    Published Online: Jun. 9, 2022

    The Author Email: Chen Bin (chenbin@wust.edu.cn)

    DOI:10.3788/LOP202259.1312002

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