INFRARED, Volume. 40, Issue 8, 31(2019)
Application of Industrial X-ray CT in Infrared Focal Plane Detectors
The application of industrial X-ray CT testers in infrared focal plane detectors is introduced. The CT can be used to non-destructively analyze the dewar components and refrigerators, especially to detect internal structural faults and defects. It can improve fault analysis ability and the efficiency of solving problems, which provide sufficient basis for component rework. In the following work, qualified samples can be selected according to the demand.This improves the user experience of the product and is an important guarantee for the subsequent production process.
Get Citation
Copy Citation Text
LI Qian, LI Da, WANG Cong, SHEN Chen, SHE We-lin, LIU Ming, GUO Xiang-xiang, JIN Shun-guo. Application of Industrial X-ray CT in Infrared Focal Plane Detectors[J]. INFRARED, 2019, 40(8): 31
Category:
Received: Jul. 23, 2019
Accepted: --
Published Online: Dec. 5, 2019
The Author Email: Qian LI (liqianbuaa@126.com)