Optoelectronics Letters, Volume. 15, Issue 2, 93(2019)

Resolution and contrast enhancement in optical sub-traction microscopy with annular aperture

Zheng-ya LI... Xiang-hui WANG*, Fei FAN, Jie-rong CHENG and Sheng-jiang CHANG |Show fewer author(s)
Author Affiliations
  • Tianjin Key Laboratory of Optoelectronic Sensor and Sensing Network Technology, Institute of Modern Optics, Nankai University, Tianjin 300350, China
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    A method for improving lateral resolution and reducing imaging distortion of optical subtraction microscopy is pro-posed. First, an azimuthally polarized (AP) light is modulated by an annular aperture. Then, an image with higher lat-eral resolution is obtained by subtracting an image obtained by an annular AP beam from an image obtained by a ra-dially polarized beam. The simulation results demonstrate that compared with the case without the annular aperture, negative side-lobes in the effective point spread function are effectively suppressed, and the imaging quality of sub-traction microscopy is obviously enhanced.

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    LI Zheng-ya, WANG Xiang-hui, FAN Fei, CHENG Jie-rong, CHANG Sheng-jiang. Resolution and contrast enhancement in optical sub-traction microscopy with annular aperture[J]. Optoelectronics Letters, 2019, 15(2): 93

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    Paper Information

    Received: Aug. 18, 2018

    Accepted: Oct. 9, 2018

    Published Online: Apr. 16, 2019

    The Author Email: Xiang-hui WANG (wangxianghui@nankai.edu.cn)

    DOI:10.1007/s11801-019-8135-0

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