Acta Optica Sinica, Volume. 22, Issue 7, 852(2002)

Development of Elementary Arrangement for Exterme Ultraviolet Projection Lithography

[in Chinese]*, [in Chinese], [in Chinese], and [in Chinese]
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    The prototype for extreme ultraviolet projection lithography at 13 nm wavelength includes a laser plasma source, an ellipsoidal condenser, a transmission mask, the Schwarzschild objective, a resist coated wafer and the associated vacuum apparatus. The optical design is optimized to achieve a resolution better than 0.1 μm over a 0.1 mm diameter image field of view.

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    [in Chinese], [in Chinese], [in Chinese], [in Chinese]. Development of Elementary Arrangement for Exterme Ultraviolet Projection Lithography[J]. Acta Optica Sinica, 2002, 22(7): 852

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    Paper Information

    Category: Instrumentation, Measurement and Metrology

    Received: Jun. 25, 2001

    Accepted: --

    Published Online: Aug. 8, 2006

    The Author Email: (jincs@sklao.ac.cn)

    DOI:

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