Acta Photonica Sinica, Volume. 42, Issue 7, 817(2013)
Calculation of Pseudo-brewster Angle for Substrate and Thin Film-substrate System
Numerical calculation of pseudo-Brewster angles for substrate and thin-film substrate system is demonstrated. The results show: for only substrates, pseudo-Brewster angles are mainly affected by refractive index when the extinction coefficient is lower than 0.01; when the extinction coefficient is above 0.1, the pseudo-Brewster angle is also modulated by the extinction coefficient. The studies indicate: for thin film-substrate systems, pseudo-Brewster angle is influenced by both refractive index and physical thickness of thin film together with optical constants of substrate; in the HfO2 film on silicon and fused silica substrate systems, pseudo-Brewster angles exhibit quasi-periodic characteristic with variation of incident wavelength or thin film thickness, as caused by interference effect.
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LIU Hua-song, JIANG Yu-gang, WANG Li-shuan, JIANG Cheng-hui, JI Yi-qin. Calculation of Pseudo-brewster Angle for Substrate and Thin Film-substrate System[J]. Acta Photonica Sinica, 2013, 42(7): 817
Received: Jan. 21, 2013
Accepted: --
Published Online: Jul. 16, 2013
The Author Email: Hua-song LIU (liuhuasong@gmail.com)